Dead / no power
Classify pre-prompt and post-prompt current, then localize trigger, input, PMIC, clock, reset or storage stage.
Case-first repair workspace
Start with the phone’s evidence.
Select the closest failure route or open the structured intake. AIFlasher uses device identity and measured evidence to localize the next test; unsupported combinations return an honest gap.
Abnormal current draw
Compare observed behavior against overlapping bands; confirm with the required rail, clock or USB test.
Charging
Separate VBUS/CC/data-path, charger IC, battery/NTC and system-rail faults using measurement context.
Storage / boot
Use USB identity, last good boot stage, storage rails and bus evidence before reflashing or reworking UFS/eMMC.
iPhone panic / restore
Match repeated panic tokens and restore errors to the affected domain, model applicability and confirmation test.
Flashing / tool error
Identify platform, exact error token, firmware class and tool stage before treating a software failure as hardware.
Case journey
Each route returns the next measurement—not an unsupported final verdict.
1 · Identify
brand → model → board → CPU → PMIC → storageDevice index →2 · Observe
symptom → current → USB → charging → tool logEnter evidence →3 · Localize
last good stage → first missing dependencyBoot atlas →4 · Confirm
rail / signal / resistance / scope / known caseKnowledge →